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                  產品目錄
                  聯系我們
                  • 聯系人 : 包經理
                  • 聯系電話 : 13564973354
                  • 傳真 : 021-66879013
                  • 移動電話 : 185-0168-7915
                  • 地址 : 上海市普陀區金沙江路1006號7樓A室。
                  • Email : byx@ratests.com.cn
                  • 郵編 : 201908
                  • 公司網址 : http://www.youngflysanctified.com
                  • MSN : 微信:18501687915
                  • QQ : 349371902
                  產品詳情
                  • 產品名稱:Model 58212-CLED Mapping Probe Tester

                  • 產品型號:
                  • 產品廠商:臺灣Chroma
                  • 產品價格:0
                  • 折扣價格:0
                  • 產品文檔:
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                  簡單介紹:
                  The Chroma 58212-C features an automated LED wafer/chip probe tester, delivering fast and accurate LED measurements with test times less than 125ms *1. The system can be modified to support different LED structures including Lateral, Vertical, and Flip Chip designs. Integrated scanners provide autonomous wafer mapping to guarantee precision testing. The patented probe head prevents device scratch
                  詳情介紹:

                  Chroma's unique design acquires and analyzes optical data such as the dominant wave length, peak wavelength, and CCT. Additionally, it provides essential electrical data such as forward voltage, leakage current, and reverse breakdown voltage, all in one test step.

                  The 58212-C includes a user-friendly graphical interface and advanced logic algorithms to significantly increase production efficiency. Comprehensive statistical reports and analysis tools allow for easy control and mass production management.

                  Note *1 : Test condition: under 300um sample pitch, 5 electrical test parameters and 1 optical parameter. Due to differences in LED characteristics, the measurement results may vary.

                  • High speed and accuracy
                  • Lateral, vertical, and flip chip
                  • Wide power test range (up to 200V/2A)
                  • Up to 8 inch wafers
                  • Chroma® Huge Photo Detector
                  • Unique edge sensor
                  • Patented probe head
                  • Robust Z-Axis stage
                  • Wafer mapping algorithm
                  • External light shielding enclosure
                  • Analysis tools and statistical reports

                  Test Items

                  • Electrical parameters:
                    - Forward Voltage Measurement (Vf )
                    - Reverse Breakdown Voltage Measurement (Vrb)
                    - Reverse Leakage Current (Ir)
                    - SCR detection
                  • Optical parameters:
                    - Optical power (mw, lm, mcd)
                    - Dominant Wavelength (Wd)
                    - Peak Wavelength (Wp)
                    - Full Width at Half Maximum (FWHM)
                    - CIExy - CCT - CRI

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